October 10, 2008
Home
About
Submit Press Release
PR Firms
Editors/Journalists
Search Archives
 
News Releases by Category  
News by Country  
News by MSA  
All News for Today  
Browse News by Day  
News by Trackbacks  
All Press Releases for September 7, 2005 Subscribe to this News Feed  
 

RELEX Free Webcast: Microscopy for Nanomaterials Characterization by Dr. Nan Yao from Princeton University

"Microscopy for Nanomaterials Characterization," a free Webcast by Dr. Nan Yao, Director of the Imaging and Analysis Center, Materials Institute, Princeton University - is now available on-demand

New York, NY (PRWEB) September 7, 2005 –- The free Webcast "Microscopy for Nanomaterials Characterization," by Dr. Nan Yao, Director of the Imaging and Analysis Center, Materials Institute, Princeton University - is now available on-demand.

This Webcast was first broadcasted live at the Research Lab Expo (RELEX), an online conference and virtual exhibition launched by the Reed Business Information Science.

To register for this free Webcast, visit: http://relex.unisfair.com/registration.jsp?code=1225

Webcast Summary:
Science and technology are ever seeking to build structures of progressively smaller size. This effort at miniaturization has finally reached the point where structures and materials can be built through "atom-by-atom" engineering. Typical chemical bonds separate atoms by a fraction of a nanometer (10-9 m), and the term nanotechnology has been coined for this emerging area of development.

By manipulating the arrangements and bonding of atoms, materials can be designed with a far vaster range of physical, chemical and biological properties than has been previously conceived. But how does one characterize the relationship between starting composition, which can be controlled, with the resulting structure and properties of a nanoscale-designed material that has superior and unique performance?

Microscopy is essential to the development of nanotechnology, serving as its eyes and hands. This presentation comprehensively covers the state-of-the-art electron and ion microscopy techniques that observe, characterize, measure and manipulate materials on the nanometer scale.

To register for this free Webcast, visit: http://relex.unisfair.com/registration.jsp?code=1225

About Dr. Nan Yao:
Nan Yao is the Director of the Imaging and Analysis Center at Princeton Institute for the Science and Technology of Materials, Princeton Univ. After receiving a Ph.D. in applied physics and electron microscopy from Arizona State Univ., Yao went to work in the field of industry, first at the Shell Development Co., then at the Exxon Research and Engineering Co.

Yao joined Princeton Univ. in 1993 to help build an imaging and analysis program, which now is one of the preeminent imaging and analysis centers in the country. Yao is on the faculty of Materials Science and Engineering and is a Senior Research Scholar with continued appointment at Princeton.

His research has focused on using advanced imaging and spectroscopy techniques to conduct fundamental studies of the structure-composition-processing-property relationships in complex materials such as self-assembled organic/inorganic composites, functional block copolymer thin films, carbon nanotubes, superconductors, minerals, ferroelectric nano-crystallites, and other materials. Yao has recently published a book entitled Handbook of Microscopy for Nanotechnology" and authored over 130 research papers.

He is also on the Editorial Board for three professional journals and serves as a referee for many others. For the past several years, Yao has chaired and co-chaired eight international symposia and served on the NASA panel for Ceramic and Nanotechnology. He is actively involved in teaching activities for both graduate and undergraduate students. Currently, he teaches a core course entitled "Characterization of Materials" and co-teaches two other courses at Princeton.

To register for this free Webcast, visit: http://relex.unisfair.com/registration.jsp?code=1225

About RELEX:
The Research Lab Expo (RELEX) is an online conference and virtual exhibition launched by the Reed Business Information Science Group. The online event features a high quality educational forum comprised of multiple live free Webcasts.

The Research Lab Expo offers cutting-edge compelling web content to industry professionals and decision makers across multiple industries, including aerospace and defense, automotive, chemicals, petroleum, coatings, inks, adhesives, textiles, computers, software, office equipment, energy, utilities, environmental, food, beverage, tobacco, government lab, industrial equipment, instruments, laboratory, design, manufacturing, metal, materials, pharmaceuticals, biopharmaceuticals, healthcare, plastic, rubber, paper, pulp wood, scientific, medical, test instruments, semiconductors, electronic components, and telecom.

###


See the original story at: http://www.prweb.com/releases/2005/09/prweb281349.htm
Other Releases by this Member
Email this story to a colleague
Printer Friendly Version
Bookmark with del.icio.us
Bookmark with Y!MyWeb
Submit to Digg
Boaz Babai
ARPU~UP
+972-54-5700157
Email us Here

There are no multimedia files attached to this release. If this is your release you may add images or other multimedia files through your login.

If you have any questions regarding information in these press releases please contact the company listed in the press release. Please do not contact PRWeb. We will be unable to assist you with your inquiry. PRWeb disclaims any content contained in these release. Our complete disclaimer appears here.
 
Disclaimer: If you have any questions regarding information in these press releases please contact the company listed in the press release.
Please do not contact PRWeb®. We will be unable to assist you with your inquiry.
PRWeb® disclaims any content contained in these releases. Our complete disclaimer appears here.

© Copyright 1997-2007, Vocus PRW Holdings, LLC.
Vocus, PRWeb and Publicity Wire are trademarks or registered trademarks of Vocus, Inc. or Vocus PRW Holdings, LLC.

Terms of Service | Privacy Policy | Copyright